solutions for magnetic technology
MET-4885 & MET-4886 Mammoth Class of Bar Testers. The Metawafer Technologies Production (MET-4886) and Engineering (MET-4885) Mammoth Class On-Bar Test Systems incorporate optimized per-pin parallel test hardware, firmware and software to achieve extreme throughput (UPH, Units per Hour). These systems can test simultaneously from one to seventy-four sliders on a bar, yet have a conventional tester footprint. These proven engineering and production testers provide best-in-class magnetic and electric measurements for disk and tape drive heads.
The Mammoth Class of testers can be preconfigured to support multiple readers per slider, typically 2 or 3, and can probe greater than 11-pad sliders with 30 μm by 50 μm bond pads with a position accuracy better than ±2 μm.
Scalable measurement resources are available per-pin for parallel DC and AC measurements for all sliders on a bar. The AC measurements include Spectral Noise, Popcorn Noise, and Magnetic Field Noise. Measurements frequency is selectable: 100 MHz, 500 MHz or 2 GHz.
Quasi-static and Transfer R-H curves on all sliders are done in seconds with transverse fields across the width of the bar. Temperature can be set or cycled between -20 °C and 250 °C.
MET-4888 Volume HSA Tester. A Head Stack Assembly is the mechanism with the disc heads mounted on the arm that the disc platter slides between. Both the disc heads and the controller logic are tested in situ.
The Metawafer Technologies’ solution leverages our proven Parallel Test system, now with robotic technology to provide exceptional throughput. Due to the reduced complexity of electronics, the tester is robust and has a superior uptime.
The MET-3800 On-wafer MRAM, Spintronics or Magnetic Sensors Tester. Magnetic RAM, is the apparent successor for the ubiquitous FLASH devices. FLASH technology is reaching performance limits due to scaling. The MET-3800 also has the ability to test on-wafer magnetic sensors under a 3D field.
Metawafer was instrumental in the creation of a serial MRAM tester and spintronics that is being used at Doway (China). It was designed as a multi-axis magnetic field for 3D magnetic bias for transfer and quasi-static measurements.
The MET-3800 is the next generation of MRAM and Sensors tester for Metawafer. The previous measurement techniques plus the current high volume technology results in the best of class production tester.