RELIABILITY, PARAMETRIC, PARAMETRIC TEST, SEMICONDUCTOR, MAGNETIC TEST, DISC HEAD TEST, JEDEIC, SDR, RDA, PDQ, PDQ-WLR, iRDA, iSDR, iPDQ, TEST, 4070, TEST SHELL

solutions  for  semiconductor technology



It's our passion

Our passion is semiconductor parametric and reliability measurements. Out staff has over a 100 years of real hands-on experience. Our products have been used at almost all the tier one semiconductor manufacturers worldwide.
Key Product Offerings: Classical and Modern Measurement Suites 

There are two key product types for semiconductor test:
  • Classical. These are the measurements and tools previously sold by Core Wafer Systems as an OEM to Agilent Technologies (now Keysight Technologies). In November 2011, Metawafer purchased perpetual rights from CWS to sell their product catalog as well as owning rights to derivatives.  The original products run only on Windows XP and HPUX and were certified for 90nm or greater technologies. For customers looking to copy exactly existing legacy test cells, the Metawafer refurbished suite allows confidence in getting the same results with improved trustworthiness.

  • Modern. The ï-products are a major upgrade from the Classical ones. The ï-products support modern controllers  (Windows 8/7/XP), expanded instrument support, embedded K4200, as well as increased functionality such as parallel for instruments and HVM test system. New measurements continue be developed in cooperation with our world class partnerships. 
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Click for Comparison of Key Semiconductor Products from Metawafer.
ïPDQ Measurement Suite for Modern Technologies

iPDQ algorithms are required for today’s technology development and assessment. The new 10th generation include on-the- fly techniques down to 60 microseconds, provide for DC and AC reliability testing of gate oxides, bias-temperature instability (BTI) as well a solid bedrock of 100 algorithms.  Reliability tests for 60 nm and below are no longer exclusive to the DC domain; AC reliability is vital thus requiring tools that that have the right measurements and support non-traditional resources. The current 10th generation ïPDQ is the answer for reducing development cycle time while helping control maturing processes.
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Click for Table of Measurements in ïPDQ 10
ïSDR, Today's Sensible Solution for Today and Tomorrow's Test

ïSDR (E3500A) is a fully-realized cost-effective package for today’s and tomorrow’s testing. It integrates a spectrum of multiple-vendor measurement resources, has a powerful intuitive executive for creating and executing tests, and showcases ïPDQ 10, the most trusted reliability test library proven worldwide.; ïSDR provides out-of-the-box productivity and confidence. Hardware resources are characterized so measurements using different models or brands return consistent results. Your TDDB or Vt measurements using a Keysight B1500 in one lab will match the same test using a Keithley 4200.

For fast identification and prediction of reliability problems at all phases of the IC life cycle — development, qualification, production — ïSDR with ïPDQ 10 is the proven answer.
ïRDA,  Information from Data in Minutes, not Hours or Days

ïRDA  (E4100A) is a PC-based parametric and reliability data analysis environment tailored for rapid and intuitive transformation of data into information.  ïRDA provides a library of standard JEDEC and enhanced analysis techniques; 
effortlessly calculate device lifetime, and visualization of  parametic and reliability relationships.
Reliability using High Volume Production Tester
with Agilent/Keysight 4080/4070/4062UX Testers

 For acquiring statistically-meaningful data sets, the standard solution has been the Agilent (Keysight) parametric system tester running SPECS with either ïPDQ or PDQ-WLR as a plugin library. 

ïPDQ runs under LINUX and HP-UX, while the legacy PDQ-WLR only supports HP-UX.



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ïPDQ on 4080 Test Systems